top of page
Si3N4 300kV [001] thickness = 5.2nm
You can check the effect of residual aberrations, which is important for aberration corrected electron microscopy, on the sample and observation purpose, and estimate the allowable amount.
Cs 1 mm -> 0
Cs vs df and C5, ( i.e. Scherzer focus, and +C5 )
2-fold astigmatism
4-fold astigmatism
Star and 6-fold astigmatism
Coma and 3-fold astigmatism
5-fold astigmatism, 3-lobe, 4th order coma
Hemoglobin 300kV
Achromatic line : (analytical calculation vs numerical calculation)
Spatial coherence reduced by the odd symmetric wave aberration
bottom of page